IITKGP

Neeraj Kumar Goyal

Associate Professor

Subir Chowdhury School of Quality and Reliability

+91-3222-283990

ngoyal@hijli.iitkgp.ac.in

RAMS for Railway Systems (5-9 Dec 2022, Online) |

Responsibilities

  • Professor-in-Charge, Ranking & IOE

Research Areas

  • Accelerated Life Testing
  • RAMS for Railway Systems
  • System Reliability Modeling
  • Communication Network Reliability
*  To define and evaluate user oriented reliability and risk indices for various engineering systems.
*  To research reliability and risk problems of engineering systems and processes with focus on Indian conditions.
*  To develop RAMS tools to find optimum, reliable and cost effective solutions.
*  To develop efficient approaches for reducing complexity of RAMS models to making them efficient and practical.
  • Minimal Path-Based Reliability Model for Wireless Sensor Networks With Multistate Nodes Chakraborty S., Goyal N. K., Mahapatra S. , Soh S. By IEEE Transactions on Reliability 69 382-400 (2020)
  • Prediction of restoration factor for various maintenance types of railway systems using analytical hierarchy process Das T.K., Goyal N.K., Gautam A. By Journal of Quality in Maintenance Engineering 26 399-430 (2019)
  • A Monte-Carlo Markov chain approach for coverage-area reliability of mobile wireless sensor networks with multistate nodes Chakraborty S., Goyal N.K., Mahapatra S., Soh S. By Reliability Engineering and System Safety 193 - (2020)
  • On Area Coverage Reliability of Mobile Wireless Sensor Networks with Multistate Nodes Chakraborty S., Goyal N.K., Soh S. By IEEE Sensors Journal 20 4992-5003 (2020)
  • Single Event Transient (SET) Mitigation Circuits with Immune Leaf Nodes Sajjade F.M., Goyal N.K., Varaprasad B.K.S.V.L. By IEEE Transactions on Device and Materials Reliability 21 70-78 (2021)
  • Rule-Based Design for Multiple Nodes Upset Tolerant Latch Architecture Sajjade F. M., Goyal N. K., B.k.s.v.l V. By IEEE Transactions on Device and Materials Reliability 19 680-687 (2019)
  • Radiation Hardened by Design Latches รข A Review and SEU Fault Simulations Sajjade F.M., Goyal N.K., Varaprasad B.K.S.V.L., Moogina R. By Microelectronics Reliability 83 127-135 (2018)
  • Irredundant Subset Cut Enumeration for Reliability Evaluation of Flow Networks Chakraborty S., Goyal N. K. By IEEE Transactions on Reliability 64 1194-1202 (2015)
  • Reliability Analysis of Multistage Interconnection Networks S R., Goyal N. K. By Quality and Reliability Engineering International 32 - (2015)
  • An Efficient Reliability Evaluation Approach for Networks with Simultaneous Multiple Node Pair Flow Requirements Chakraborty S., Goyal N. K. By Quality and Reliability Engineering International 33 1067-1082 (2017)

Principal Investigator

  • AI Powered Public Battery Swapping Station for e-rickshaws IIT KHARAGPUR AI4ICPS I HUB FOUNDATION

Ph. D. Students

Amandeep Nagpal

Area of Research: Reliability Data Analytics

Ashrit Swain

Area of Research: System Resiliency

Namrata Mohanty

Area of Research: Reliability of Maintained Systems

Partha Chakrabarti

Area of Research: Network Reliability

Shikha Dwivedi

Area of Research: Software Reliability

Subir Kumar Patra

Area of Research: Quality of New Product Development